Invention Grant
- Patent Title: Die stack and integrated device structure including improved bonding structure and methods of forming the same
-
Application No.: US17460180Application Date: 2021-08-28
-
Publication No.: US11869859B2Publication Date: 2024-01-09
- Inventor: Jen-Yuan Chang
- Applicant: Taiwan Semiconductor Manufacturing Company Limited
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee Address: TW Hsinchu
- Agency: The Marbury Law Group, PLLC
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L29/40 ; H01L23/00 ; H01L23/58

Abstract:
A die stack includes: a first die including a first semiconductor substrate; a second die including a second semiconductor substrate; a bonding dielectric structure including a bonding polymer and that bonds the first die and the second die; a bonding interconnect structure that extends through the bonding dielectric structure to bond and electrically connect the first die and the second die; and a bonding dummy pattern that extends through the bonding dielectric structure to bond the first die and the second die. The bonding dummy pattern is electrically conductive and is electrically floated.
Public/Granted literature
Information query
IPC分类: