Invention Grant
- Patent Title: Overshoot current detection and correction circuit for electrical fast transient events
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Application No.: US16411251Application Date: 2019-05-14
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Publication No.: US11870246B2Publication Date: 2024-01-09
- Inventor: Shishir Goyal , Lokesh Kumar Gupta
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Frank D. Cimino
- Main IPC: H02H9/04
- IPC: H02H9/04 ; G01R19/10 ; H02H1/00 ; G01R19/165 ; H03K17/082

Abstract:
A positive overshoot detection circuit comprises a transistor coupled to a current mirror, a reference current source coupled to the current mirror, and a comparator coupled to the reference current source and the current mirror. The comparator output indicates whether the current mirror's current is greater than the reference current source's current. A control input and a current terminal of the transistor are coupled to a clamping circuit. A negative overshoot detection circuit comprises a biasing sub-circuit coupled to a transistor, a resistor coupled to the transistor, and a comparator coupled to the transistor and the resistor. The comparator output indicates whether the transistor is in an on or off state. The biasing sub-circuit is coupled to a clamping circuit. In some implementations, the comparator outputs from the positive and negative overshoot detection circuits are provided to a driver circuit, which modifies its operation.
Public/Granted literature
- US20200303920A1 OVERSHOOT CURRENT DETECTION AND CORRECTION CIRCUIT FOR ELECTRICAL FAST TRANSIENT EVENTS Public/Granted day:2020-09-24
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