- Patent Title: Depth data measuring head, measurement device and measuring method
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Application No.: US17437512Application Date: 2019-12-03
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Publication No.: US11885613B2Publication Date: 2024-01-30
- Inventor: Minjie Wang , Yushi Liang
- Applicant: SHANGHAI PERCIPIO TECHNOLOGY LIMITED
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI PERCIPIO TECHNOLOGY LIMITED
- Current Assignee: SHANGHAI PERCIPIO TECHNOLOGY LIMITED
- Current Assignee Address: CN Shanghai
- Agency: IPro, PLLC
- Priority: CN 1910199180.3 2019.03.15 CN 1910329849.6 2019.04.23 CN 1910356663.X 2019.04.29 CN 1910400277.6 2019.05.13
- International Application: PCT/CN2019/122667 2019.12.03
- International Announcement: WO2020/186825A 2020.09.24
- Date entered country: 2021-09-09
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G06T7/521 ; G01B11/22

Abstract:
A depth data measuring head (300), a measurement device (1400) and a measurement method. The measuring head (300) comprises: a projection device (310, 1410) used to project and scan line coded structured light across a region to be photographed; first and second image sensors (310_1, 310_2, 1410_1, 1410_2) disposed at preset relative positions and used to photograph said region so as to respectively obtain first and second two-dimensional image frames under irradiation of the structured light; and a synchronization device (330, 1430) used to synchronously activate, on the basis of a scan position of the projection device, pixel columns of the first and second image sensors (310_1, 310_2, 1410_1, 1410_2) in a line direction corresponding to the current scan position to perform imaging.
Public/Granted literature
- US20220155059A1 DEPTH DATA MEASURING HEAD, MEASUREMENT DEVICE AND MEASURING METHOD Public/Granted day:2022-05-19
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