Invention Grant
- Patent Title: Abnormality determination method, abnormality determination device, and abnormality determination system
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Application No.: US17705649Application Date: 2022-03-28
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Publication No.: US11885721B2Publication Date: 2024-01-30
- Inventor: Kenta Sato
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP 21054822 2021.03.29
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G01M99/00

Abstract:
An abnormality determination method includes: a first distance calculation step of calculating, based on measurement data of an object, a first Mahalanobis distance in a first unit space corresponding to a normal mode of the object; a second distance calculation step of calculating, based on the measurement data, an (i+1)-th Mahalanobis distance in an (i+1)-th unit space corresponding to an i-th abnormal mode of the object for each integer i greater than or equal to 1 and less than or equal to N, N being an integer greater than or equal to 2; and an abnormality determination step of determining, based on the second to (N+1)-th Mahalanobis distances, one of the first to N-th abnormal modes where the object is when the first Mahalanobis distance exceeds a threshold value.
Public/Granted literature
- US20220307946A1 Abnormality Determination Method, Abnormality Determination Device, And Abnormality Determination System Public/Granted day:2022-09-29
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