Invention Grant
- Patent Title: Calibration method and device therefor
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Application No.: US17363950Application Date: 2021-06-30
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Publication No.: US11885752B2Publication Date: 2024-01-30
- Inventor: Emmanuel St-Aubin , Philippe Desjeans-Gauthier , Ola El Bakry , Simon Archambault , William Awad
- Applicant: Rapiscan Holdings, Inc.
- Applicant Address: US CA Hawthorne
- Assignee: Rapiscan Holdings, Inc.
- Current Assignee: Rapiscan Holdings, Inc.
- Current Assignee Address: US CA Hawthorne
- Agency: Novel IP
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G01N23/04 ; G01N23/087 ; G01N23/10 ; G01V5/00

Abstract:
A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.
Public/Granted literature
- US20230000459A1 CALIBRATION METHOD AND DEVICE THEREFOR Public/Granted day:2023-01-05
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