Invention Grant
- Patent Title: Automated scan data quality assessment in ultrasonic testing
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Application No.: US17352957Application Date: 2021-06-21
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Publication No.: US11885767B2Publication Date: 2024-01-30
- Inventor: Bruno Abreu Calfa , Mahmoud El Chamie , Amit Surana , Ozgur Erdinc
- Applicant: Raytheon Technologies Corporation
- Applicant Address: US CT Farmington
- Assignee: RTX Corporation
- Current Assignee: RTX Corporation
- Current Assignee Address: US CT Farmington
- Agency: Bachman & LaPointe, P.C.
- Main IPC: G01N29/04
- IPC: G01N29/04 ; G01N29/34 ; G01N29/44

Abstract:
A system comprising a computer readable storage device readable by the system, tangibly embodying a program having a set of instructions executable by the system to perform the following steps for detecting a sub-surface defect, the set of instructions comprising an instruction to receive scan data for a part from a transducer; an instruction to collect the scan data; an instruction to determine an indication in the scan data that indicates a distractor, wherein the indication is based on a learning phase module and an inference phase module that the processor uses to self-assess the indication; and an instruction to create a defect indication report.
Public/Granted literature
- US20220404317A1 AUTOMATED SCAN DATA QUALITY ASSESSMENT IN ULTRASONIC TESTING Public/Granted day:2022-12-22
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