Invention Grant
- Patent Title: Testers, testing systems and methods of testing electrical components
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Application No.: US17664724Application Date: 2022-05-24
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Publication No.: US11885854B2Publication Date: 2024-01-30
- Inventor: Michael H. Shaffer , Gustavo Sanchez Taccone , Aaron Cullen , Ronan Conneely , Stonewall Jackson Craig, III , Jimmy D Hart , Charles Wallace Thompson
- Applicant: GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Applicant Address: US MI Detroit
- Assignee: GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Current Assignee: GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Current Assignee Address: US MI Detroit
- Agency: Lorenz & Kopf LLP
- Main IPC: G01R31/58
- IPC: G01R31/58 ; G01R31/00

Abstract:
A tester for testing an electrical component. The tester includes a database of testing specifications for electrical components, a tester connector for physically and electrically connecting to different electrical components, and an output device. The tester identifies an electrical component connected to the tester connector and provide corresponding identification data, retrieves a testing specification from the database using the identification data, commands a test of the electrical component according to the testing specification, and outputs an indication of a result of the test through the output device.
Public/Granted literature
- US20230384397A1 TESTERS, TESTING SYSTEMS AND METHODS OF TESTING ELECTRICAL COMPONENTS Public/Granted day:2023-11-30
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