Invention Grant
- Patent Title: Automatically identifying a diagnostic analyzer applicable to a diagnostic artifact
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Application No.: US17526176Application Date: 2021-11-15
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Publication No.: US11886322B2Publication Date: 2024-01-30
- Inventor: Del Myers , William Xie , Mark Anthony Jelf Downie , Joseph Mark Schmitt , Justin Michael Anderson , Gregory Bernard Miskelly , Claudiu-Constantin Guiman
- Applicant: Microsoft Technology Licensing, LLC
- Applicant Address: US WA Redmond
- Assignee: Microsoft Technology Licensing, LLC
- Current Assignee: Microsoft Technology Licensing, LLC
- Current Assignee Address: US WA Redmond
- Agency: Workman Nydegger
- Main IPC: G06F11/36
- IPC: G06F11/36

Abstract:
Methods, systems, and computer program products for using a confidence measure to automatically identify a diagnostic analyzer that applies to a diagnostic artifact. A plurality of diagnostic analyzers are each configured to analyze diagnostic artifacts relating to prior executions of software entities. A confidence measure is calculated for each diagnostic analyzer. Each confidence measure indicates a likelihood that the diagnostic analyzer applies to a particular diagnostic artifact. Calculating each confidence measure comprises applying one or more heuristics specific to the diagnostic analyzer against the particular diagnostic artifact, with an outcome of application of each heuristic contributing to the confidence measure for the respective diagnostic analyzer. Based at least on calculating the confidence measure for each diagnostic analyzer, and based on one or more determined thresholds, it is determined whether to include each diagnostic analyzers in a set of diagnostic analyzers with which to analyze the particular diagnostic artifact.
Public/Granted literature
- US20230153227A1 AUTOMATICALLY IDENTIFYING A DIAGNOSTIC ANALYZER APPLICABLE TO A DIAGNOSTIC ARTIFACT Public/Granted day:2023-05-18
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