Invention Grant
- Patent Title: Test information extraction apparatus, test information extraction method and program
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Application No.: US17772095Application Date: 2019-10-28
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Publication No.: US11886328B2Publication Date: 2024-01-30
- Inventor: Takuya Iwatsuka , Haruto Tanno , Toshiyuki Kurabayashi
- Applicant: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
- Current Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
- Current Assignee Address: JP Tokyo
- International Application: PCT/JP2019/042170 2019.10.28
- International Announcement: WO2021/084581A 2021.05.06
- Date entered country: 2022-04-26
- Main IPC: G06F11/36
- IPC: G06F11/36 ; G06F9/455 ; G06F21/57 ; G06F9/445

Abstract:
A test information extraction device improves efficiency in testing applications by including: an obtainment unit that obtains, from a first source code group of an application that implements methods corresponding to requests of a plurality of types received via a network, first information used for generating the requests; and an extraction unit that specifies, from among the methods implemented in response to the requests, a method being a caller of a method included in a second source code group being a part of the first source code group and that further extracts, from the first information, second information used for generating one of the requests corresponding to the specified method.
Public/Granted literature
- US20220374343A1 TEST INFORMATION EXTRACTION APPARATUS, TEST INFORMATION EXTRACTION METHOD AND PROGRAM Public/Granted day:2022-11-24
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