Invention Grant
- Patent Title: Automated machine learning test system
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Application No.: US17840745Application Date: 2022-06-15
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Publication No.: US11886329B2Publication Date: 2024-01-30
- Inventor: Steven Joseph Gardner , Connie Stout Dunbar , David Bruce Elsheimer , Gregory Scott Dunbar , Joshua David Griffin , Yan Gao
- Applicant: SAS Institute Inc.
- Applicant Address: US NC Cary
- Assignee: SAS Institute Inc.
- Current Assignee: SAS Institute Inc.
- Current Assignee Address: US NC Cary
- Agency: Bell & Manning, LLC
- Main IPC: G06F11/36
- IPC: G06F11/36

Abstract:
A computing device selects new test configurations for testing software. (A) First test configurations are generated using a random seed value. (B) Software under test is executed with the first test configurations to generate a test result for each. (C) Second test configurations are generated from the first test configurations and the test results generated for each. (D) The software under test is executed with the second test configurations to generate the test result for each. (E) When a restart is triggered based on a distance metric value computed between the second test configurations, a next random seed value is selected as the random seed value and (A) through (E) are repeated. (F) When the restart is not triggered, (C) through (F) are repeated until a stop criterion is satisfied. (G) When the stop criterion is satisfied, the test result is output for each test configuration.
Public/Granted literature
- US20220308989A1 AUTOMATED MACHINE LEARNING TEST SYSTEM Public/Granted day:2022-09-29
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