Invention Grant
- Patent Title: Electronic component evaluation method, electronic component evaluation device, and electronic component evaluation program
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Application No.: US17211953Application Date: 2021-03-25
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Publication No.: US11887290B2Publication Date: 2024-01-30
- Inventor: Daichi Gemba , Junji Morita
- Applicant: SUMIDA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SUMIDA CORPORATION
- Current Assignee: SUMIDA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP 20076717 2020.04.23
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/62 ; G06T7/70

Abstract:
An electronic component evaluation method of evaluating a state of an electronic component includes acquiring reference point information, with respect to at least one terminal, reference point information including at least one of position information and first height information of a plurality of corresponding reference points on the terminal from imaging data obtained by image-capturing the electronic component including a component body and a plurality of terminals attached to the component body, and determining a state according to a shape of the electronic component based on a plurality of pieces of the reference point information.
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