- Patent Title: Automated analysis of lattice structures using computed tomography
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Application No.: US18299177Application Date: 2023-04-12
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Publication No.: US11887297B2Publication Date: 2024-01-30
- Inventor: Bryan E. Schiefelbein , Christopher Alan Griffiths
- Applicant: Honeywell Federal Manufacturing & Technologies, LLC
- Applicant Address: US MO Kansas City
- Assignee: Honeywell Federal Manufacturing & Technologies, LLC
- Current Assignee: Honeywell Federal Manufacturing & Technologies, LLC
- Current Assignee Address: US MO Kansas City
- Agency: Erise IP, P.A.
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T3/40

Abstract:
Systems, methods, and computer-readable media for evaluating a set of computed tomography data associated with a lattice structure. The lattice structure may be additively manufactured. The computed tomography data may be segmented using a filter for identifying blob-like structures to identify nodes present within the lattice structure. A three-dimensional path traversal is applied to volumetric data to identify a plurality of struts within the lattice structure that are compared to corresponding struts within a set if three-dimensional mesh data of the lattice structure to identify defective struts. Further, two-dimensional slices may be extracted from each of the computed tomography data and the mesh data and compared to identify one or more inconsistencies indicative of defects within the lattice structure.
Public/Granted literature
- US20230334654A1 AUTOMATED ANALYSIS OF LATTICE STRUCTURES USING COMPUTED TOMOGRAPHY Public/Granted day:2023-10-19
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