Invention Grant
- Patent Title: Method and apparatus for classifying a brain anomaly based on a 3D MRI image
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Application No.: US17268221Application Date: 2018-11-15
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Publication No.: US11887300B2Publication Date: 2024-01-30
- Inventor: Pershung Louis Lee , Wei Sheng Chan , Jiahao Ji , Zhenzhou Wu
- Applicant: BEIJING ANDE YIZHI TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BEIJING ANDE YIZHI TECHNOLOGY CO., LTD.
- Current Assignee: BEIJING ANDE YIZHI TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: HAUPTMAN HAM, LLP
- Priority: CN 1810918731.2 2018.08.13
- International Application: PCT/CN2018/115535 2018.11.15
- International Announcement: WO2020/034469A 2020.02.20
- Date entered country: 2021-02-12
- Main IPC: G06T7/12
- IPC: G06T7/12 ; G06T7/00 ; G06V10/764 ; G06V10/77 ; G06V10/82

Abstract:
The present disclosure discloses a method and an apparatus for classifying a brain anomaly and apparatus based on a 3D MRI image, wherein the classifying method comprises: receiving a to-be-processed 3D MRI image, performing a convolution operation on an imaging sequence corresponding to the 3D MRI image based on a first neural network algorithm to obtain segment masks; and performing a classification operation on the imaging sequence corresponding to the 3D MRI image based on a second neural network algorithm and the segment masks to obtain a classification result of the brain anomaly. Supported by the technologies of artificial intelligence and big data processing, embodiments of the present disclosure enable classification of a brain anomaly shown in the received MRI image through training an MRI recognition model, thereby effectively improving classification accuracy of the brain anomaly and further enhancing diagnosis accuracy of the brain anomaly based on the MRI image.
Public/Granted literature
- US20210319555A1 METHOD AND APPARATUS FOR CLASSIFYING A BRAIN ANOMALY BASED ON A 3D MRI IMAGE Public/Granted day:2021-10-14
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