Invention Grant
- Patent Title: Anti-fuse memory cell circuit, array circuit and reading and writing method thereof
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Application No.: US17432808Application Date: 2020-02-22
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Publication No.: US11887682B2Publication Date: 2024-01-30
- Inventor: Xin Li
- Applicant: ChangXin Memory Technologies, Inc.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Alston & Bird LLP
- Priority: CN 1910931356 2019.09.29
- International Application: PCT/CN2020/076311 2020.02.22
- International Announcement: WO2021/056958A 2021.04.01
- Date entered country: 2021-08-20
- Main IPC: G11C17/16
- IPC: G11C17/16 ; G11C17/06 ; G11C17/18

Abstract:
An anti-fuse memory unit circuit, an array circuit and a reading and writing method are disclosed. The advantages of the device and method include: 1. the anti-fuse memory cell circuit is a pure combinational circuit, compared to time sequence circuit, after a delay of a certain time, this disclosed device closes all paths and stops the logic action of entire circuit, thus lowering the static power consumption to approximately 0; 2. this circuit constituted two positive feedback loops through the design of a switch and a logic calculation module, which enables its readout circuit to read “0” or “1” more reliably; 3. this circuit can eliminate a complicated timing sequence control part, even output the anti-fuse codes directly without latching the readout circuit output OUTA/OUTB; 4. this circuit layout is flexible.
Public/Granted literature
- US20220122680A1 ANTI-FUSE MEMORY CELL CIRCUIT, ARRAY CIRCUIT AND READING AND WRITING METHOD THEREOF Public/Granted day:2022-04-21
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