Invention Grant
- Patent Title: Method of cleaning plasma processing apparatus and plasma processing apparatus
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Application No.: US17443561Application Date: 2021-07-27
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Publication No.: US11887824B2Publication Date: 2024-01-30
- Inventor: Yasutaka Hama , Nobuaki Shindo
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JP 20131871 2020.08.03
- Main IPC: H01J37/32
- IPC: H01J37/32 ; H01L21/02

Abstract:
A method of cleaning a plasma processing apparatus includes: disposing a first dummy substrate at a first position with respect to a stage inside a chamber and performing a first dry cleaning process inside the chamber; and disposing a second dummy substrate at a second position with respect to the stage inside the chamber and performing a second dry cleaning process inside the chamber, wherein each of a center of the first position and a center of the second position is located at a different position from a center of the stage in a plan view, and wherein the first position and the second position are different from each other in a plan view.
Public/Granted literature
- US20220037133A1 METHOD OF CLEANING PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING APPARATUS Public/Granted day:2022-02-03
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