- Patent Title: Method for forming active region array and semiconductor structure
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Application No.: US17372878Application Date: 2021-07-12
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Publication No.: US11887859B2Publication Date: 2024-01-30
- Inventor: Erxuan Ping , Zhen Zhou , Yanghao Liu
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Cooper Legal Group, LLC
- Priority: CN 2010134688.8 2020.03.02
- Main IPC: H01L21/308
- IPC: H01L21/308 ; H10B12/00

Abstract:
A method for forming an active region array and a semiconductor structure are provided. The method for forming the active region array includes the steps of: providing a substrate; forming a first mask layer on a surface of the substrate, a first etched pattern being provided in the first mask layer; forming a second mask layer covering a surface of the first mask layer; forming a third mask layer having a second etched pattern on a surface of the second mask layer; forming a flank covering a sidewall of the second etched pattern; removing the third mask layer to form a third etched pattern between adjacent flanks; etching the first mask layer along the third etched pattern to form a fourth etched pattern in the first mask layer; and etching the substrate along the first etched pattern and the fourth etched pattern, to form multiple active regions in the substrate.
Public/Granted literature
- US20210343537A1 METHOD FOR FORMING ACTIVE REGION ARRAY AND SEMICONDUCTOR STRUCTURE Public/Granted day:2021-11-04
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