Invention Grant
- Patent Title: Membrane defect inspection method and membrane defect inspection device
-
Application No.: US17296069Application Date: 2019-12-03
-
Publication No.: US11890581B2Publication Date: 2024-02-06
- Inventor: Keishi Watanabe , Shintaro Nishimoto , Tetsuya Uenaka , Fang Zhao , Akira Matsunaga
- Applicant: KUBOTA CORPORATION
- Applicant Address: JP Osaka
- Assignee: KUBOTA CORPORATION
- Current Assignee: KUBOTA CORPORATION
- Current Assignee Address: JP Osaka
- Agency: Oliff PLC
- Priority: JP 18232096 2018.12.12
- International Application: PCT/JP2019/047120 2019.12.03
- International Announcement: WO2020/121881A 2020.06.18
- Date entered country: 2021-05-21
- Main IPC: B01D65/10
- IPC: B01D65/10 ; C02F1/44 ; G01N29/07 ; G06T7/00

Abstract:
A membrane defect inspection method is for a membrane module set including a plurality of membrane modules connected in parallel under a straight pipe portion of gas detection piping extending in a horizontal direction and communicating with primary spaces in the plurality of membrane modules to which raw water is supplied or secondary spaces. The method includes a gas injection process where gas is injected into spaces opposite to the primary spaces or the secondary spaces communicating with the gas detection piping while the gas detection piping is filled with water, and an echo detection process where an ultrasonic sensor is brought into contact with an end portion of the straight pipe portion of the gas detection piping, and a reflected wave of an ultrasonic wave transmitted from the ultrasonic sensor is detected.
Public/Granted literature
- US20210394123A1 MEMBRANE DEFECT INSPECTION METHOD AND MEMBRANE DEFECT INSPECTION DEVICE Public/Granted day:2021-12-23
Information query