Invention Grant
- Patent Title: Optical measurement system, optical measurement method, and non-transitory storage medium having measurement program stored thereon
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Application No.: US17655899Application Date: 2022-03-22
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Publication No.: US11892281B2Publication Date: 2024-02-06
- Inventor: Shiro Kawaguchi , Kazuya Nakajima , Hayato Takizawa , Goro Maeda
- Applicant: Otsuka Electronics Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: Studebaker & Brackett PC
- Priority: JP 21048379 2021.03.23
- Main IPC: G01B11/06
- IPC: G01B11/06 ; G01J3/02 ; G01J3/10 ; G01B5/00 ; G01N21/27 ; G01B9/02055 ; G01J3/28 ; G01N21/25 ; G01B21/04

Abstract:
An optical measurement system includes a light source, a spectroscopic detector, a reference sample, a switching mechanism that switches between a first optical path through which a sample to be measured is irradiated with light from the light source and light produced at the sample is guided to the spectroscopic detector and a second optical path through which the reference sample is irradiated with light from the light source and light produced at the reference sample is guided to the spectroscopic detector, and a processing unit that calculates, by performing correction processing based on change between a first detection result at first time and a second detection result at second time, a measurement value of the sample from a third detection result provided from the spectroscopic detector as a result of irradiation of the sample with light from the light source at third time temporally proximate to the second time.
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