Invention Grant
- Patent Title: Spectrometric device and spectrometric method
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Application No.: US17423948Application Date: 2019-12-20
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Publication No.: US11892352B2Publication Date: 2024-02-06
- Inventor: Kazuya Iguchi , Hideki Masuoka
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JP 19007632 2019.01.21
- International Application: PCT/JP2019/050199 2019.12.20
- International Announcement: WO2020/153070A 2020.07.30
- Date entered country: 2021-07-19
- Main IPC: G01J3/32
- IPC: G01J3/32

Abstract:
A spectroscopic measurement apparatus includes an optical system, a photodetector, and an analysis unit. The optical system guides measurement target light from an object to a light receiving surface of the photodetector, and forms a spectral image of the measurement target light on the light receiving surface of the photodetector. The photodetector includes the light receiving surface on which a plurality of pixels are arranged respectively on a plurality of rows. The photodetector receives the spectral image for a first exposure time by a plurality of pixels in a first region on the light receiving surface, and outputs first spectrum data. The photodetector receives the spectral image for a second exposure time by a plurality of pixels in a second region on the light receiving surface, and outputs second spectrum data. The second exposure time is longer than the first exposure time.
Public/Granted literature
- US11852535B2 Spectrometric device and spectrometric method Public/Granted day:2023-12-26
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