Invention Grant
- Patent Title: Controlled curvature correction in high accuracy thermal sensor
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Application No.: US17136240Application Date: 2020-12-29
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Publication No.: US11892360B2Publication Date: 2024-02-06
- Inventor: Atul Dwivedi , Pijush Kanti Panja
- Applicant: STMicroelectronics International N.V.
- Applicant Address: CH Geneva
- Assignee: STMicroelectron nternational N.V.
- Current Assignee: STMicroelectron nternational N.V.
- Current Assignee Address: CH Geneva
- Agency: Crowe & Dunlevy
- Main IPC: G01K7/00
- IPC: G01K7/00 ; H03K17/60

Abstract:
Circuitry generates base-to-emitter voltages (Vbe1, Vbe2) of two BJTs biased at different current densities, a base-to-emitter voltage (Vbe) of a BJT biased so Vbe is complementary to absolute temperature and has a curved non-linearity across temperature, and base-to-emitter voltages (Vbe1_c, Vbe2_c) of two BJTs biased by a temperature independent constant current and a current proportional to absolute temperature so Vbe2_c−Vbe1_c has the same but opposite curved non-linearity across temperature as Vbe. A sampling circuit samples these voltages and provides them to inputs of a loop filter. Filter outputs are quantized to produce a bitstream. The sampling circuit: when the received bit of the bitstream is zero, causes integration of Vbe1−Vbe2 to produce a voltage proportional to absolute temperature (αΔVbe); and when the received bit of the bitstream is one, causes integration of Vbe2_c−Vbe_Vbe1_c to produce a negative voltage complementary to absolute temperature −Vbe_c without non-linearity across temperature.
Public/Granted literature
- US20210239540A1 CONTROLLED CURVATURE CORRECTION IN HIGH ACCURACY THERMAL SENSOR Public/Granted day:2021-08-05
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