- Patent Title: Reflective depth interrogation for analyte measurement in liquids
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Application No.: US18238300Application Date: 2023-08-25
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Publication No.: US11892400B1Publication Date: 2024-02-06
- Inventor: Thomas G Campbell , Jacob Y Wong
- Applicant: Airware, Inc.
- Applicant Address: US CA Newbury Park
- Assignee: AIRWARE, INC
- Current Assignee: AIRWARE, INC
- Current Assignee Address: US CA Newbury Park
- Agent Roy L Anderson
- Main IPC: G01N33/487
- IPC: G01N33/487 ; G01N21/31 ; G01N21/35 ; A61B5/145 ; A61B5/00 ; G01N21/3577 ; A61B5/1455 ; G01N21/21 ; G01N33/49

Abstract:
An absorption spectroscopy process uses a single radiation beam with two or more pulsed beams (including at least a signal beam and a reference beam) that are passed into a liquid sample to a variable effective depth and then reflected out of the liquid sample where it is detected and processed to obtain a value over a preselected time. As values are determined for multiple effective depths, a sampling dataset is obtained which is used to calculate a concentration level of a targeted particle in the liquid sample by use of calibration dataset obtained from use of known samples.
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