Invention Grant
- Patent Title: Method of examining diabetic complication
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Application No.: US16764595Application Date: 2018-11-16
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Publication No.: US11892456B2Publication Date: 2024-02-06
- Inventor: Ryoji Nagai , Naoyuki Taniguchi
- Applicant: TOKAI UNIVERSITY EDUCATIONAL SYSTEM , RIKEN
- Applicant Address: JP Tokyo
- Assignee: TOKAI UNIVERSITY EDUCATIONAL SYSTEM,RIKEN
- Current Assignee: TOKAI UNIVERSITY EDUCATIONAL SYSTEM,RIKEN
- Current Assignee Address: JP Tokyo; JP Saitama
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP 17221846 2017.11.17
- International Application: PCT/JP2018/042575 2018.11.16
- International Announcement: WO2019/098351A 2019.05.23
- Date entered country: 2020-05-15
- Main IPC: G01N33/66
- IPC: G01N33/66 ; G01N33/68

Abstract:
A marker for examining a diabetic complication comprising a compound represented by the following Formula (1), or a salt thereof. A method of examining a diabetic complication with an amount of the marker as an indicator including: (A) a step of measuring the amount of the marker in a sample collected from a test subject; and (B) a step of determining presence or absence, or a risk of development of the diabetic complication based on a result of measurement of the amount of the marker comprising Formula (1), or a salt thereof:
Information query
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