Invention Grant
- Patent Title: Testing machine and testing method
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Application No.: US17480369Application Date: 2021-09-21
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Publication No.: US11892499B2Publication Date: 2024-02-06
- Inventor: Kang Lv , Yang Xiong , Jian Hu
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Cooper Legal Group, LLC
- Priority: CN 2011519537.0 2020.12.21
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/26

Abstract:
Embodiments of the present application provide a testing equipment and a testing method. The testing equipment includes: a plurality of pad groups and a plurality of source measure units. Each of the pad groups has a stress pad. The stress pad is configured to connect an element under test. The source measure unit is configured to send an input signal to the element under test through the stress pad and measure an output signal of the element under test to acquire performance parameters of the element under test. The stress pads of at least two of the pad groups are connected to the corresponding source measure units at the same time. The embodiments of the present application help improve the testing efficiency.
Public/Granted literature
- US20220196726A1 TESTING MACHINE AND TESTING METHOD Public/Granted day:2022-06-23
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