Invention Grant
- Patent Title: Method of operating testing system
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Application No.: US17449261Application Date: 2021-09-29
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Publication No.: US11892816B2Publication Date: 2024-02-06
- Inventor: Cheng-Sung Lai
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agency: CKC & Partners Co., LLC
- Main IPC: G05B19/4065
- IPC: G05B19/4065

Abstract:
A method of operating a testing system comprising a plurality of testing slots. The method comprising: testing the testing slots; obtaining a current testing data from the testing slots; determining whether one of the testing slots is abnormal by comparing the current testing data with a former testing data; shutting down the one of the testing slots and sending a repairing notification if the one of the testing slots is determined to be abnormal; performing a confirmation procedure to determine whether the one of the testing slots is repaired to be normal; and restarting the one of the testing slots if the one of the testing slots passes the confirmation procedure.
Public/Granted literature
- US20230101758A1 METHOD OF OPERATING TESTING SYSTEM Public/Granted day:2023-03-30
Information query
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