Invention Grant
- Patent Title: Monitoring apparatus, method, and program
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Application No.: US17680374Application Date: 2022-02-25
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Publication No.: US11892829B2Publication Date: 2024-02-06
- Inventor: Yasunori Taguchi , Kouta Nakata , Susumu Naito , Yuichi Kato , Eiichi Ookuma , Toshio Aoki , Chikashi Miyamoto
- Applicant: KABUSHIKI KAISHA TOSHIBA , Toshiba Energy Systems & Solutions Corporation
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA ENERGY SYSTEMS & SOULTIONS CORPORATION
- Current Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA ENERGY SYSTEMS & SOULTIONS CORPORATION
- Current Assignee Address: JP Tokyo; JP Kanagawa
- Agency: Holtz, Holtz & Volek PC
- Priority: JP 21150380 2021.09.15
- Main IPC: G05B23/02
- IPC: G05B23/02

Abstract:
According to one embodiment, a monitoring apparatus includes a processing circuit. The processing circuit is configured to generate second data including a prediction value of a second sensor correlated with a first sensor from first data including a measurement value of the first sensor of which a measurement value changes suddenly in a case where the control signal changes, detect an anomaly of the system or an anomaly of at least one sensor, and make it difficult to detect the anomaly in a case where the determination signal indicates that there is a change in the control signal.
Public/Granted literature
- US20230084342A1 MONITORING APPARATUS, METHOD, AND PROGRAM Public/Granted day:2023-03-16
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