An image sticking test method and an image sticking test device. The image sticking test method includes: acquiring a first correspondence between a source-drain current of a preset drive transistor and time within a first preset time after a voltage of the preset drive transistor in an array substrate is switched from a first preset voltage to a second preset voltage; acquiring a second correspondence between a source-drain current of the preset drive transistor and time within a second preset time after the voltage of the preset drive transistor is switched from a third preset voltage to the second preset voltage; and acquiring a first image sticking test curve of the array substrate according to the first correspondence, the second correspondence and an image sticking evaluation formula, where the first image sticking test curve is a correspondence between time and an image sticking evaluation value.