Invention Grant
- Patent Title: Method for measuring temperature in integrated circuit, integrated circuit having temperature sensor, and display device
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Application No.: US17964640Application Date: 2022-10-12
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Publication No.: US11893916B2Publication Date: 2024-02-06
- Inventor: Yong Sung Ahn , Hyo Joong Kim , Jae Sik Cho
- Applicant: LX Semicon Co., Ltd.
- Applicant Address: KR Daejeon
- Assignee: LX SEMICON CO., LTD.
- Current Assignee: LX SEMICON CO., LTD.
- Current Assignee Address: KR Daejeon
- Agency: ROTHWELL, FIGG, ERNST & MANBECK, P.C.
- Priority: KR 20210140521 2021.10.20 KR 20220079599 2022.06.29
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G01K7/16
Abstract:
An embodiment relates to a method of measuring an ambient temperature by using a temperature sensor provided in an integrated circuit (IC) and a measurement error of a temperature sensor may be improved by correcting an output value of a temperature sensor by using a correction value stored in a memory.
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