Invention Grant
- Patent Title: Electron beam apparatus and method for controlling electron beam apparatus
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Application No.: US17621503Application Date: 2019-07-02
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Publication No.: US11894211B2Publication Date: 2024-02-06
- Inventor: Erina Kawamoto , Soichiro Matsunaga , Souichi Katagiri , Keigo Kasuya , Takashi Doi , Tetsuya Sawahata , Minoru Yamazaki
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Volpe Koenig
- International Application: PCT/JP2019/026322 2019.07.02
- International Announcement: WO2021/001932A 2021.01.07
- Date entered country: 2021-12-21
- Main IPC: H01J37/077
- IPC: H01J37/077 ; H01J37/075 ; H01J37/18

Abstract:
The invention provides an electron beam apparatus that reduces a time required for an electron gun chamber to which a sputter ion pump and a non-evaporable getter pump are connected to reach an extreme high vacuum state. The electron beam apparatus includes an electron gun configured to emit an electron beam and the electron gun chamber to which the sputter ion pump and the non-evaporable getter pump are connected. The electron beam apparatus further includes a gas supply unit configured to supply at least one of hydrogen, oxygen, carbon monoxide, and carbon dioxide to the electron gun chamber.
Public/Granted literature
- US20220351934A1 ELECTRON BEAM APPARATUS AND METHOD FOR CONTROLLING ELECTRON BEAM APPARATUS Public/Granted day:2022-11-03
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