Invention Grant
- Patent Title: Ultra narrow trench patterning with dry plasma etching
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Application No.: US17826528Application Date: 2022-05-27
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Publication No.: US11894237B2Publication Date: 2024-02-06
- Inventor: Chao-Hsuan Chen , Yuan-Sheng Huang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L21/308
- IPC: H01L21/308 ; H01L21/8234 ; H01L21/3213

Abstract:
A method includes forming a polymer layer on a patterned photo resist. The polymer layer extends into an opening in the patterned photo resist. The polymer layer is etched to expose the patterned photo resist. The polymer layer and a top Bottom Anti-Reflective Coating (BARC) are etched to pattern the top BARC, in which the patterned photo resist is used as an etching mask. The top BARC is used as an etching mask to etching an underlying layer.
Public/Granted literature
- US20220285165A1 Ultra Narrow Trench Patterning with Dry Plasma Etching Public/Granted day:2022-09-08
Information query
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