Invention Grant
- Patent Title: Semiconductor structure and manufacturing method thereof
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Application No.: US17467556Application Date: 2021-09-07
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Publication No.: US11895821B2Publication Date: 2024-02-06
- Inventor: Jingwen Lu , Haihan Hung , Bingyu Zhu
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Cooper Legal Group, LLC
- Priority: CN 2010685792.6 2020.07.16
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L29/66 ; H10B12/00

Abstract:
A semiconductor structure and a manufacturing method thereof are provided. The manufacturing method of the semiconductor structure includes: providing a substrate; forming on an upper surface of the substrate first patterns each including a first main body and a first flank wall covering a sidewall of the first main body; forming a filling layer which covers the first flank wall and fills a gap between adjacent first patterns; and etching a top of each of the first patterns to obtain second main bodies, second flank walls and protrusions located on upper surfaces of the second flank walls, the second flank wall covering a sidewall of the second main body, and a top of the protrusion being at least higher than a top of the second main body.
Public/Granted literature
- US20220020749A1 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF Public/Granted day:2022-01-20
Information query
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