- Patent Title: Method for forming semiconductor structure by using sacrificial layer configured to be replaced subsequently to form bit line, semiconductor structure, and memory
-
Application No.: US17460414Application Date: 2021-08-30
-
Publication No.: US11895852B2Publication Date: 2024-02-06
- Inventor: Yiming Zhu , Erxuan Ping
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Cooper Legal Group, LLC
- Priority: CN 2010343487.9 2020.04.27
- Main IPC: H01L21/76
- IPC: H01L21/76 ; H10B99/00 ; H01L21/768 ; H01L27/088 ; H01L29/06 ; H01L29/66 ; H01L29/78

Abstract:
A method for forming a semiconductor structure includes: providing a substrate, a sacrificial layer and active layer on sacrificial layer being formed on the substrate; etching the active layer and sacrificial layer up to a surface of the substrate to form a plurality of active lines arranged in parallel and extending along first direction; filling an opening located between two adjacent ones of active lines to form a first isolating layer; etching an end of active lines to form an opening hole; removing sacrificial layer along opening hole, to form a gap between a bottom of the active lines and substrate; filling a conductive material in the gap to form a bit line extending along first direction; patterning the active lines to form a plurality of separate active pillars arrayed along first direction and second direction; and forming semiconductor pillars on top surfaces of respective ones of the active pillars.
Public/Granted literature
- US20210391330A1 SEMICONDUCTOR STRUCTURE, METHOD FOR FORMING SEMICONDUCTOR STRUCTURE AND MEMORY Public/Granted day:2021-12-16
Information query
IPC分类: