Invention Grant
- Patent Title: Chemical-mechanical polishing solution
-
Application No.: US16958338Application Date: 2018-12-26
-
Publication No.: US11898063B2Publication Date: 2024-02-13
- Inventor: Wenting Zhou
- Applicant: Anji Microelectronics (Shanghai) Co., Ltd.
- Applicant Address: CN Shangai
- Assignee: ANJI MICROELECTRONICS (SHANGHAI) CO., LTD.
- Current Assignee: ANJI MICROELECTRONICS (SHANGHAI) CO., LTD.
- Current Assignee Address: CN Shanghai
- Agency: Dentons US LLP
- Priority: CN 1711439535.9 2017.12.27
- International Application: PCT/CN2018/124053 2018.12.26
- International Announcement: WO2019/129106A 2019.07.04
- Date entered country: 2020-12-21
- Main IPC: C09G1/02
- IPC: C09G1/02

Abstract:
The present invention discloses a chemical mechanical polishing slurry, and the chemical mechanical polishing slurry comprises silica abrasive particles and accelerating agents, wherein the accelerating agents are selected from pyridine compound, piperidine compound, pyrrolidine compound or pyrrole compound and their derivatives, which have one or more carboxyl groups, and pyrimidine compound and its derivatives, which have one or more amino groups. The chemical mechanical polishing slurry can simultaneously increase the removal rate of both silicon nitride and polysilicon.
Public/Granted literature
- US20210163786A1 CHEMICAL-MECHANICAL POLISHING SOLUTION Public/Granted day:2021-06-03
Information query