Invention Grant
- Patent Title: Adjustment method and measurement method
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Application No.: US17540855Application Date: 2021-12-02
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Publication No.: US11898838B2Publication Date: 2024-02-13
- Inventor: Taisuke Yamauchi
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP 20201006 2020.12.03
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G06T7/521

Abstract:
There is provided an adjustment method including, identifying correspondence between a projector coordinate system and a camera coordinate system, detecting brightness of a first area of a second captured image and brightness of a second area of the second captured image, estimating a range of first brightness of a third area of a second image, estimating a range of second brightness of a fourth area of the second image, and adjusting brightness of a fifth area corresponding to the third area in a projection image projected from the projector so as to fall within the range of the first brightness and adjusting brightness of a sixth area corresponding to the fourth area in the projection image so as to fall within the range of the second brightness.
Public/Granted literature
- US20220182519A1 ADJUSTMENT METHOD AND MEASUREMENT METHOD Public/Granted day:2022-06-09
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