Invention Grant
- Patent Title: Techniques to mitigate asymmetric long delay stress
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Application No.: US17690614Application Date: 2022-03-09
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Publication No.: US11900980B2Publication Date: 2024-02-13
- Inventor: Angelo Visconti
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G11C11/12
- IPC: G11C11/12 ; G11C11/22

Abstract:
Methods, systems, and devices for techniques to mitigate asymmetric long delay stress are described. A memory device may activate a memory cell during a first phase of an access operation cycle. The memory device may write a first state or a second state to the memory cell during the first phase of the access operation cycle. The memory device may maintain the first state or the second state during a second phase of the access operation cycle after the first phase of the access operation cycle. The memory device may write, during a third phase of the access operation cycle after the second phase of the access operation cycle, the second state to the memory cell. The memory device may precharge the memory cell during the third phase of the access operation cycle based on writing the second state to the memory cell.
Public/Granted literature
- US20220199138A1 TECHNIQUES TO MITIGATE ASYMMETRIC LONG DELAY STRESS Public/Granted day:2022-06-23
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