A method and a device for testing a memory chip are provided. The method includes: writing test data into memory cells of a memory chip to-be-tested; reading stored data from the memory cells; and generating a test result of the memory chip to-be-tested according to the test data and the stored data; a word line turn-on voltage tested in the memory chip to-be-tested being greater than a standard bit line and word line turn-on voltage of the memory chip to-be-tested, and/or a sense amplification time tested in the memory chip to-be-tested being greater than a standard sense amplification time of the memory chip to-be-tested.