Invention Grant
- Patent Title: Method of manufacturing semiconductor element and semiconductor element
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Application No.: US17327005Application Date: 2021-05-21
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Publication No.: US11901233B2Publication Date: 2024-02-13
- Inventor: Kazuki Yamaguchi , Yoshitaka Sumitomo
- Applicant: NICHIA CORPORATION
- Applicant Address: JP Anan
- Assignee: NICHIA CORPORATION
- Current Assignee: NICHIA CORPORATION
- Current Assignee Address: JP Anan
- Agency: Foley & Lardner LLP
- Priority: JP 20090108 2020.05.22 JP 21075885 2021.04.28
- Main IPC: H01L21/78
- IPC: H01L21/78 ; B23K26/53 ; B23K26/40 ; H01L23/544 ; B23K101/40

Abstract:
A method of manufacturing a semiconductor element includes a first irradiation step in which a laser beam is irradiated to form, in the interior of the substrate, a plurality of first modified portions aligned along a first direction; a second irradiation step in which a laser beam is irradiated to form a plurality of second modified portions aligned along the first direction at a position adjacent to the plurality of first modified portions in the second direction; and a third irradiation step which a laser beam is irradiated to form a plurality of third modified portions aligned along the first direction at a position closer to the first surface than the first modified portions and overlapping the plurality of first modified portions in a thickness direction of the substrate.
Public/Granted literature
- US20210366772A1 METHOD OF MANUFACTURING SEMICONDUCTOR ELEMENT AND SEMICONDUCTOR ELEMENT Public/Granted day:2021-11-25
Information query
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