Invention Grant
- Patent Title: Semiconductor device structure and method for forming the same
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Application No.: US17460709Application Date: 2021-08-30
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Publication No.: US11901266B2Publication Date: 2024-02-13
- Inventor: Ting-Li Yang , Wen-Hsiung Lu , Lung-Kai Mao , Fu-Wei Liu , Mirng-Ji Lii
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L21/30
- IPC: H01L21/30 ; H01L23/48 ; H01L21/306 ; H01L21/768

Abstract:
A method for forming a semiconductor device structure is provided. The method includes providing a chip structure including a substrate and a wiring structure over a first surface of the substrate. The method includes removing a first portion of the wiring structure adjacent to the hole to widen a second portion of the hole in the wiring structure. The second portion has a first width increasing in a first direction away from the substrate. The method includes forming a first seed layer over the wiring structure and in the hole. The method includes thinning the substrate from a second surface of the substrate until the first seed layer in the hole is exposed. The method includes forming a second seed layer over the second surface of the substrate and the first seed layer in the hole.
Public/Granted literature
- US20230060982A1 SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME Public/Granted day:2023-03-02
Information query
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