Invention Grant
- Patent Title: Crum chip and smart card
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Application No.: US17671756Application Date: 2022-02-15
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Publication No.: US11902434B2Publication Date: 2024-02-13
- Inventor: Jong Seon Shin , Gi Jin Kang , Seung Su Jeon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR 20210063211 2021.05.17
- Main IPC: H04L9/08
- IPC: H04L9/08 ; H04L9/14 ; G06F21/60 ; G06F21/44 ; G06F21/72 ; G06F21/62 ; G06F21/79 ; G03G21/18

Abstract:
A customer replaceable unit monitor (CRUM) integrated circuit (IC) includes: a secure module configured to receive an encryption key and an encrypted test code from outside; and a CRUM module controlled by the secure module. The secure module may perform authorization on the basis of the received encryption key. The secure module may perform decryption of the encrypted test code to generate a decrypted test code. The secure module may store the decrypted test code in a volatile memory. The secure module may generate a test command based on the decrypted test code in the volatile memory, and provide the test command to the CRUM module.
Public/Granted literature
- US20220368517A1 CRUM CHIP AND SMART CARD Public/Granted day:2022-11-17
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