Invention Grant
- Patent Title: Depth measurement
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Application No.: US16700457Application Date: 2019-12-02
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Publication No.: US11902497B2Publication Date: 2024-02-13
- Inventor: Vasileios Laganakos , Irenéus Johannes De Jong
- Applicant: Arm Limited
- Applicant Address: GB Cambridge
- Assignee: Arm Limited
- Current Assignee: Arm Limited
- Current Assignee Address: GB Cambridge
- Agency: EIP US LLP
- Priority: EP 386047 2019.11.28
- Main IPC: H04N13/271
- IPC: H04N13/271 ; H04N23/67 ; H04N13/00

Abstract:
A method comprising the steps of obtaining image data captured at an image sensor using a focus configuration. A distance is determined for one or more objects in the image data, based on the focus configuration and a sharpness characteristic of the image data of the object. A depth map is then generated based on the determined distance.
Public/Granted literature
- US20210168348A1 DEPTH MEASUREMENT Public/Granted day:2021-06-03
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