- Patent Title: Processes, apparatuses and system for measuring a measured variable
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Application No.: US17771308Application Date: 2020-10-19
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Publication No.: US11921070B2Publication Date: 2024-03-05
- Inventor: Nils Trautmann , Ulrich Vogl , Jörg Wrachtrup , Rainer Stöhr
- Applicant: Carl Zeiss AG
- Applicant Address: DE Oberkochen
- Assignee: Carl Zeiss AG
- Current Assignee: Carl Zeiss AG
- Current Assignee Address: DE Oberkochen
- Agency: KUSNER & JAFFE
- Priority: DE 2019128932.7 2019.10.25
- International Application: PCT/EP2020/079366 2020.10.19
- International Announcement: WO2021/078684A 2021.04.29
- Date entered country: 2022-04-22
- Main IPC: G01V3/00
- IPC: G01V3/00 ; G01N21/64 ; G01N24/10 ; G01R33/00 ; G01R33/26 ; G01R33/60

Abstract:
It is an object of the invention to improve processes, apparatuses and systems for measuring a measured variable. To this end, a measured variable is measured in a measuring process on the basis of an NV center as a quantum sensor. The NV center has a plurality of quantum states and is optically excitable on the basis of an occupancy of one of the quantum states into at least one excited state of the quantum states by means of an excitation light. The at least one excited state can decay at least with emission of emission light of the NV center. In the measuring process, the NV center is irradiated by the excitation light, the excitation light having a time periodic modulation, and a respective occupancy probability and/or a respective lifetime of the quantum states depending on the measured variable and the excitation light. A phase shift is determined between the emission light of the NV center and the modulation of the excitation light and a measurement value for the measured variable is determined on the basis thereof.
Public/Granted literature
- US20220365012A1 PROCESSES, APPARATUSES AND SYSTEM FOR MEASURING A MEASURED VARIABLE Public/Granted day:2022-11-17
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