Invention Grant
- Patent Title: Semiconductor structure and method of forming the same
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Application No.: US17742974Application Date: 2022-05-12
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Publication No.: US11921318B2Publication Date: 2024-03-05
- Inventor: Xiaojun Chen , Honglin Zeng , Xia Feng , Dongsheng Zhang , Xiage Yin , Jiaheng Wu
- Applicant: Semiconductor Manufacturing International (Shanghai) Corporation , Semiconductor Manufacturing International (Beijing) Corporation
- Applicant Address: CN Shanghai
- Assignee: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- Current Assignee: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- Current Assignee Address: CN Shanghai; CN Beijing
- Agency: Anova Law Group, PLLC
- Priority: CN 2110523253.7 2021.05.13
- Main IPC: G02B6/124
- IPC: G02B6/124 ; G02B6/12 ; G02B6/13

Abstract:
A method of forming a semiconductor structure includes: providing an initial substrate having a first region and a second region; forming a first substrate on the initial substrate; forming a first insulating layer on the first substrate; forming a second substrate on the first insulating layer; removing the second substrate in the second region to form a second insulating layer on the first insulating layer in the second region; and forming a plurality of passive devices on the second insulating layer in the second region and forming a plurality of active devices on the second substrate in the first region.
Public/Granted literature
- US20220365275A1 SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME Public/Granted day:2022-11-17
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