Invention Grant
- Patent Title: Method to efficiently evaluate a log pattern
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Application No.: US17293059Application Date: 2019-12-19
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Publication No.: US11921571B2Publication Date: 2024-03-05
- Inventor: Serverius Petrus Paulus Pronk , Johannes Henricus Maria Korst , Mauro Barbieri
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/EP2019/086209 2019.12.19
- International Announcement: WO2020/127663A 2020.06.25
- Date entered country: 2021-05-12
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G06F11/30 ; G06F11/32

Abstract:
A non-transitory computer-readable medium stores instructions readable and executable by at least one electronic processor (10, 12, 14) to perform a log pattern analysis method (300) by applying a log pattern to log data undergoing analysis comprising log events which are time stamped and which are defined by values for a set of fields. The log data undergoing analysis are stored on a server (30) accessible by the at least one electronic processor via an electronic network (31). The log pattern analysis method includes: constructing a retrieval query to select log events that are in a time interval and that also satisfy at least one additional constraint associated with the log pattern and defined on one or more filter fields of the set of fields; downloading a sub-set of the log data undergoing analysis from the server to the at least one electronic processor via the electronic network, wherein the sub-set is selected from the log data undergoing analysis by the retrieval query; applying the log pattern to the downloaded sub-set of the log data undergoing analysis to identify log pattern hits in the log data undergoing analysis; and controlling a display screen (16) to display a report of the log pattern hits in the log data undergoing analysis.
Public/Granted literature
- US20210397499A1 METHOD TO EFFICIENTLY EVALUATE A LOG PATTERN Public/Granted day:2021-12-23
Information query