Methods and systems for a pivoting source with tracking detector for transverse dual energy absorptiometry
Abstract:
Various systems are provided for an X-ray system. In one example, an X-ray system comprises an X-ray source positioned opposite to and facing a first side of a table and an X-ray detector positioned directly opposite to and facing a second side of the table, wherein the second side is opposite the first side, wherein the X-ray source is a dual-energy X-ray source configured to scan in a raster pattern. In one example, an object is positioned on the first side of the table.
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