Invention Grant
- Patent Title: High ruggedness heterojunction bipolar transistor (HBT)
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Application No.: US17148709Application Date: 2021-01-14
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Publication No.: US11929427B2Publication Date: 2024-03-12
- Inventor: Chao-Hsing Huang , Yu-Chung Chin , Kai-Yu Chen
- Applicant: VISUAL PHOTONICS EPITAXY CO., LTD.
- Applicant Address: TW Taoyuan
- Assignee: VISUAL PHOTONICS EPITAXY CO., LTD.
- Current Assignee: VISUAL PHOTONICS EPITAXY CO., LTD.
- Current Assignee Address: TW Taoyuan
- Agency: Patentrant Consulting Group
- Priority: TW 9101244 2020.01.14
- Main IPC: H01L29/73
- IPC: H01L29/73 ; H01L23/66 ; H01L29/08 ; H01L29/205 ; H01L29/737 ; H03F3/19 ; H03F3/21

Abstract:
Provided is a high ruggedness heterojunction bipolar transistor (HBT), including a collector layer. The collector layer includes a InGaP layer or a wide bandgap layer. The bandgap of the InGaP layer is greater than 1.86 eV.
Public/Granted literature
- US20210217881A1 HIGH RUGGEDNESS HETERJUNCTION BIPOLAR TRANSISTOR (HBT) Public/Granted day:2021-07-15
Information query
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