Invention Grant
- Patent Title: Microscope for quantitative wavefront measurements, microscope module and kit, method and computer program for computational wavefront reconstruction
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Application No.: US17429834Application Date: 2020-02-14
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Publication No.: US11933676B2Publication Date: 2024-03-19
- Inventor: Manuel Martínez Corral , Genaro Saavedra Tortosa , Emilio Sánchez Ortiga , Peter Török
- Applicant: UNIVERSITAT DE VALÈNCIA
- Applicant Address: ES Valencia
- Assignee: UNIVERSITAT DE VALÈNCIA
- Current Assignee: UNIVERSITAT DE VALÈNCIA
- Current Assignee Address: ES Valencia
- Agency: ICE MILLER LLP
- Priority: ES 1930116 2019.02.15
- International Application: PCT/ES2020/070101 2020.02.14
- International Announcement: WO2020/165481A 2020.08.20
- Date entered country: 2021-08-10
- Main IPC: G02B21/06
- IPC: G02B21/06 ; G01J9/00 ; G02B21/36
Abstract:
The present invention relates to a microscope for quantitative measurements of the wavefront, comprising:
means for the illumination of a sample (T);
an objective lens (2);
an ordered two-dimensional arrangement of lenses (3), with a spacing pμ greater than 500 μm and a relative aperture of less than 10;
an image sensor (4) located in a capture space (Ec) to receive the light scattered by the sample (T), and to acquire spatial and angular information on the object wavefront associated therewith; and
a computational entity to perform a computational reconstruction of the object wavefront from the spatial and angular information.
Other aspects of the invention relate to a method, a computer program and a product incorporating the same, adapted for the performance of the functions of the computational entity of the microscope, as well as to a module and a kit for a microscope.
means for the illumination of a sample (T);
an objective lens (2);
an ordered two-dimensional arrangement of lenses (3), with a spacing pμ greater than 500 μm and a relative aperture of less than 10;
an image sensor (4) located in a capture space (Ec) to receive the light scattered by the sample (T), and to acquire spatial and angular information on the object wavefront associated therewith; and
a computational entity to perform a computational reconstruction of the object wavefront from the spatial and angular information.
Other aspects of the invention relate to a method, a computer program and a product incorporating the same, adapted for the performance of the functions of the computational entity of the microscope, as well as to a module and a kit for a microscope.
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