Invention Grant
- Patent Title: Boundary scan test method and storage medium
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Application No.: US17906980Application Date: 2021-03-24
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Publication No.: US11933845B2Publication Date: 2024-03-19
- Inventor: Shiyjun Zhao , Puxia Liu , Qipan Fu
- Applicant: SHENZHEN PANGO MICROSYSTEMS CO.,LTD.
- Applicant Address: CN Shenzhen
- Assignee: SHENZHEN PANGO MICROSYSTEMS CO., LTD.
- Current Assignee: SHENZHEN PANGO MICROSYSTEMS CO., LTD.
- Current Assignee Address: CN Guangdong Province
- Priority: CN 2011171203.9 2020.10.28
- International Application: PCT/CN2021/082534 2021.03.24
- International Announcement: WO2022/088594A 2022.05.05
- Date entered country: 2022-09-22
- Main IPC: G01R31/3185
- IPC: G01R31/3185

Abstract:
A boundary scan test method is used to test connectivity of a pad having a direct connection to user logic. The method comprises the following steps: configuring an FPGA to enter a test mode; generating by means of user logic, a boundary scan chain for a boundary scan test; loading a boundary scan test instruction to the FPGA, and loading a PRELOAD instruction to a device having a pad to be tested for connectivity; sending, via a TDI port, a first test vector to the pad; performing the boundary scan test, and loading an EXTEST instruction to the device having the pad; and removing first response data from a TDO port, and performing response analysis and fault diagnosis.
Public/Granted literature
- US20230120955A1 BOUNDARY SCAN TEST METHOD AND STORAGE MEDIUM Public/Granted day:2023-04-20
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