- Patent Title: System and method for measuring second order and higher gradients
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Application No.: US18199185Application Date: 2023-05-18
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Publication No.: US11933864B2Publication Date: 2024-03-19
- Inventor: Joshua Javor , David Bishop , David Campbell , Matthias Imboden
- Applicant: Trustees of Boston University
- Applicant Address: US MA Boston
- Assignee: Trustees of Boston University
- Current Assignee: Trustees of Boston University
- Current Assignee Address: US MA Boston
- Agency: Burns & Levinson LLP
- Agent Steven M. Mills
- Main IPC: G01R33/022
- IPC: G01R33/022 ; G01R33/00 ; G01R33/038

Abstract:
A system and method of effectively measuring a change in a gradient of a magnetic field. The systems include a first magnet and a second magnet mechanically coupled together and aligned along a polarization axis. The first magnet and the second magnet are positioned such that a pair of like magnetic poles of the first magnet and the second magnet face in opposite directions. Further, the first magnet and the second magnet are configured to move along the polarization axis in response to a magnetic field. A sensing system is configured to measure a change in a gradient of the magnetic field based on the movement of the first magnet and second magnet along the polarization axis in response to the magnetic field.
Public/Granted literature
- US20230305082A1 SYSTEM AND METHOD FOR MEASURING SECOND ORDER AND HIGHER GRADIENTS Public/Granted day:2023-09-28
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