The present disclosure provides a method and an apparatus for testing a memory chip, and a storage medium, and belongs to the technical field of semiconductors. The method for testing a memory chip includes: writing test data into a memory cell of a to-be-tested memory chip; reading stored data from the memory cell; and generating a test result of the to-be-tested memory chip based on the test data and the stored data; wherein in the reading stored data from the memory cell, a row address strobe precharge time is less than a standard row address strobe precharge time of the to-be-tested memory chip, and/or a current sensing delay time of the to-be-tested memory chip is less than a standard sensing delay time of the to-be-tested memory chip.