- Patent Title: Methods and apparatus for precleaning and treating wafer surfaces
-
Application No.: US16889017Application Date: 2020-06-01
-
Publication No.: US11939666B2Publication Date: 2024-03-26
- Inventor: Xiangjin Xie , Carmen Leal Cervantes , Feng Chen , Lu Chen , Wenjing Xu , Aravind Kamath , Cheng-Hsiung Matthew Tsai , Tae Hong Ha , Alexander Jansen , Xianmin Tang
- Applicant: APPLIED MATERIALS, INC.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: MOSER TABOADA
- Main IPC: C23C16/56
- IPC: C23C16/56 ; C23C14/56 ; H01J37/32 ; H01L21/02 ; H01L21/67

Abstract:
Methods and apparatus for processing a substrate include cleaning and self-assembly monolayer (SAM) formation for subsequent reverse selective atomic layer deposition. An apparatus may include a process chamber with a processing volume and a substrate support including a pedestal, a remote plasma source fluidly coupled to the process chamber and configured to produce radicals or ionized gas mixture with radicals that flow into the processing volume to remove residue or oxides from a surface of the substrate, a first gas delivery system with a first ampoule configured to provide at least one first chemical into the processing volume to produce a SAM on the surface of the substrate, a heating system located in the pedestal and configured to heat a substrate by flowing gas on a backside of the substrate, and a vacuum system fluidly coupled to the process chamber and configured to control heating of the substrate.
Public/Granted literature
- US20210371972A1 METHODS AND APPARATUS FOR PRECLEANING AND TREATING WAFER SURFACES Public/Granted day:2021-12-02
Information query
IPC分类: