Invention Grant
- Patent Title: Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
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Application No.: US18133054Application Date: 2023-04-11
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Publication No.: US11940461B2Publication Date: 2024-03-26
- Inventor: Sergey Osechinskiy , Anthonius Ruiter , Bede Pittenger , Syed-Asif Syed-Amanulla
- Applicant: BRUKER NANO, INC.
- Applicant Address: US CA Goleta
- Assignee: BRUKER NANO, INC.
- Current Assignee: BRUKER NANO, INC.
- Current Assignee Address: US CA Goleta
- Agency: Quarles & Brady LLP
- Agent Yakov S. Sidorin
- Main IPC: G01Q60/38
- IPC: G01Q60/38 ; G01Q10/04 ; G01Q20/04 ; G01Q30/04 ; B82Y35/00
Abstract:
An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
Public/Granted literature
- US20230243867A1 Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) Public/Granted day:2023-08-03
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